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Application of Atom Probe Tomography to Nitride Semiconductors
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- Journal:
- Microscopy and Microanalysis / Volume 23 / Issue S1 / July 2017
- Published online by Cambridge University Press:
- 04 August 2017, pp. 666-667
- Print publication:
- July 2017
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A UK Facility for Atom Probe Tomography Analysis
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- Journal:
- Microscopy and Microanalysis / Volume 15 / Issue S2 / July 2009
- Published online by Cambridge University Press:
- 26 July 2009, pp. 288-289
- Print publication:
- July 2009
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Tomographic Reconstruction in Atom Probe Microscopy: Past, Present. . . Future?
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- Journal:
- Microscopy and Microanalysis / Volume 15 / Issue S2 / July 2009
- Published online by Cambridge University Press:
- 26 July 2009, pp. 10-11
- Print publication:
- July 2009
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